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Publications

  


Our management team has over 200 publications in both materials science applications and theoretical studies.  Each of the team members is both nationally and internationally acclaimed has presented at conferences worldwide.

Visit the links to the left to view publications, presentations, and patents of the management team.

 

Refereed Journal Articles (7):

1.                  Transmission Electron Microscope Specimen Preparation of Zn Powders Using the Focused Ion Beam Lift-Out Technique, B.I. Prenitzer, L.A. Giannuzzi, K. Newman, S.R. Brown, T.L. Shofner, R.B. Irwin, F.A. Stevie, Metallurgical and Materials Transactions A., SEP 01 (1998) v 29 n 9, P. 2399-2406.

 2.                  Electron Microscopy Sample Preparation For the Biological and Physical Sciences Using Focused Ion Beams, L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, T.L. Shofner, S.R. Brown, R.B. Irwin, F.A. Stevie, Journal of Process Analytical Chemistry, vol. IV, No. 3,4, (1999) p. 162-167. Figure 2 from this article was chosen as the cover art for this issue of the journal. 

3.                  Wet Thermal Oxidation of GaN, E.D. Readinger, S.D. Wolter, D.L. Waltemyer, J.M. Delucca, S.E. Mohney, B.I. Prenitzer, L.A.Giannuzzi, and R.J. Molnar, Journal of Electronic Materials, Vol. 28, No. 3, (1999), p. 257-260. 

4.                  Ion Channeling Effects on the FIB Milling of Copper, B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, Journal of Vacuum Science & Technology B, 19(3), May/Jun, (2001), 749-754.

 5.                  A Comparative Evaluation of FIB CVD Processes,  B.W. Kempshall , B.I. Prenitzer, L.A. Giannuzzi,  F.A. Stevie, and S.X. Da, Journal of Vacuum Science & Technology B, 20(1), Jan/Feb, (2002), 286-290.

 6.                  Grain Boundary Segregation: Equilibrium and Non-Equilibrium Conditions, B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, and L.A. Giannuzzi, Scripta Materialia, 47 (7), (2002), 447-451.

 7.                  The Correlation Between Ion Beam/Material Interactions and Practical FIB Specimen Preparation, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, R.B. Irwin, F.A. Stevie, Microscopy and Microanalysis. 9, 216–236, 2003 

 

Refereed Conference Proceedings (15)

1.                  Site Specific Microstructural and Analytical Characterization With the Aid of Focused Ion Beams, B.W. Kempshall, S.M. Schwarz, J.L. Lomness, B.I. Prenitzer, M.D. Hampton, and L.A. Giannuzzi, Scanning 2003 

2.                  Characterization of Si in a W matrix Using Diffraction Contrast in the TEM,  Prenitzer, B.I., B.W. Kempshall, J.M. McKinley, W.H. Stinebaugh, and I. Wylie, Proceedings Microscopy and Microanalysis 8:51-101 Cambridge University Press (2002)  

3.                  Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions, B. I. Prenitzer, B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 502-503 (2000). 

4.                  Effects of incident angle and target rotation on SIMS crater roughening, L A Giannuzzi, B I Prenitzer, J M McKinley, and F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 353-354.

 5.                  STEM analysis of FIB damage in Silicon, C Urbanik Shannon , B I Prenitzer, L A Giannuzzi , S R Brown, T L Shofner, B Rossi, C A Vartuli, R B Irwin, F A Stevie, Proceedings of the Second Conference of the International Union Microbeam Analysis Societies, Institute of Physics Conference Series Number 165, Institute of Physics Publishing, Bristol and Philadelphia, 2000, pp 177-178.

 6.                  A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening, L.A. Giannuzzi, B.W Kempshall, B.I. Prenitzer, J.M. McKinley, F. A. Stevie, 13th Annual SIMS Workshop 2000, April 30 – May 3, 2000, Lake Tahoe, NV, pp. 19-21. 

7.                  Microstructural Evaluation of SIMS Crater Roughening, B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, in Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertand, H.-N. Migeon and H.W. Werner, 2000, Elsevier, Proceedings of the 12th Annual Conference on Secondary Ion Mass Spectrometry , Brussels, Belgium, 5-11 September 1999, pp. 77-80.  

8.                  The Effect of Milling Parameters on Aspect Ratios Attainable in FIB Milled Features, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, and F.A. Stevie, 12th Annual SIMS Workshop, April 1999, p 70-72. 

9.                  In-Situ Transformation of a Zinc TEM Lift-Out Specimen, Microscopy and Microanalysis,” B.I. Prenitzer, S. Collins, and L.A. Giannuzzi, vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 928-929. 

10.              TEM FIB Lift-Out Of Mount Saint Helens Volcanic Ash, J. L. Drown-MacDonald, B. I. Prenitzer, T. L. Shofner+, and L. A. Giannuzzi, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 908-909. 

11.              Characterization of FIB Damage in Silicon, C.A. Urbanik, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossie, R.B. Irwin, and F.A. Stevie, Microscopy and Microanalysis,” vol.5, supplement 2, Proceedings: Microscopy & Microanalysis 99, (1999), 740-741. 

12.              Advances in the FIB Lift-Out Technique for TEM Specimen Preparation: HREM Lattice Imaging, L.A. Giannuzzi, B.I. Prenitzer, J.L. Drown-MacDonald, S.R. Brown, R.B. Irwin, and F.A. Stevie, T.L. Shofner, Microstructural Science, Volume 26, The 31st Annual Technical Meeting of the International Metallographical Society, (1999), 249-253. 

13.              Material Dependence of Sputtering Behavior During Focused Ion Beam Milling:  A Correlation between Monte Carlo Based Simulation and Empirical Results, B.I. Prenitzer, L. A. Giannuzzi, S. R. Brown, R. B. Irwin, T. L. Shofner, and F. A. Stevie, Microscopy and Microanalysis 1998 Proceedings, Microscopy Society of America, Springer p. 858-859 (1998). 

14.              The Influence of Incident Ion Range on the Efficiency of TEM and SEM Specimen Preparation of Focused Ion Beam Milling, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F.A. Stevie, Electron Microscopy 1998, ICEM14, Symposium K, Volume III, eds., H.A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol, (1998) 711-712. 

15.              Investigation of Variables Affecting Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation, B.I. Prentizer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F.A. Stevie, Proceedings: Microscopy and Microanalysis ’98, Vol. 4, Supplement 2, Springer, NY, 1998, p. 858.

 

Books,  Book Chapters (2) 

1.      Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice, eds. Lucille A. Giannuzzi, Brenda I. Prenitzer, and Fred A. Stevie, contracted by Kluwer/Plenum , in preparation.  

2.      FIB Lift-Out for Defect Analysis, Lucille A. Giannuzzi and Brian W. Kempshall, Shawn D. Anderson, Brenda I. Prenitzer, and Thomas M. Moore, in review for Analysis Techniques of Submicron Defects, 2002 Supplement to the EDFAS Failure Analysis Desktop Reference.

 PRESENTATIONS (33)

 

  1. Characterization of Tantalum Based Diffusion Barriers for Copper Interconnects, D. Contestable, C. S. Seet, S. Merchant, M. Oh, B. I. Prenitzer, R. B. Irwin, D. Jones, 28th Annual Symposium of the Florida Chapter of the AVS and 18th Annual Meeting of the Florida Society for Microscopy, March 2001, regional.
  2. Channeling in Cu, B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, F.A. Stevie, 3rd Annual FIB Workshop, FLAVS/FSM/Surface Analysis 2001, UCF, March 2001, International.
  1. Ion Channeling Effects on the FIB milling of crystalline materials, B.W. Kempshall, S.M.Schwarz, B.I. Prenitzer, L.A.Giannuzzi, R.B. Irwin, F.A. Stevie, Intl. AVS, Boston, October, 2000, international.
  1. Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions, B. I. Prenitzer, B. W. Kempshall, S. M. Schwarz, L. A. Giannuzzi, and F. A. Stevie, Microscopy & Microanalysis, Philadelphia, August, 2000, invited, international.
  1. Effects of incident angle and target rotation on SIMS crater roughening, L A Giannuzzi, B I Prenitzer, J M McKinley, and F A Stevie, invited, International Union Microbeam Analysis Societies, Kona, Hawaii, July 2000, international.
  1. STEM analysis of FIB damage in Silicon, C Urbanik Shannon , B I Prenitzer, L A Giannuzzi , S R Brown, T L Shofner, B Rossi, C A Vartuli, R B Irwin, F A Stevie, International Union Microbeam Analysis Societies, Kona, Hawaii, July 2000, international.
  1. A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening, L.A. Giannuzzi, B.W Kempshall, B.I. Prenitzer, J.M. McKinley, F. A. Stevie, “13th Annual SIMS Workshop 2000, April 30 – May 3, 2000, Lake Tahoe, NV, International.
  1. STEM Analysis of FIB Damage in Silicon, C. Urbanik Shannon, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossi, C.A. Vartuli, R.B. Irwin, F.A. Stevie, FL AVS/FSM, March, 2000, poster, National.
  1. Ion Channeling Effects on the FIB Milling of Copper,  B.W. Kempshall, S. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, FL AVS/FSM, March, 2000, poster, National.
  1. Ion Channeling Effects on the FIB Milling of Copper,  B.W. Kempshall, S. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, Spring Meeting of American Vacuum Society, Santa Clara, February, 2000, International.
  1. TEM and SEM Specimen Preparation by Focused Ion Beam Methods, B. I. Prenitzer, Florida Society for Microscopy tour hosted by Cirent Semiconductor, Oct. 1999, Invited, regional.
  1. A Comparative Evaluation of FIB CVD Processes, B. I. Prenitzer, B. W. Kempshall, L. A. Giannuzzi, S. X. Da and F.A. Stevie, International Meeting of the American Vacuum Society, Seattle, October, 1999. International
  1. The Effect of Milling Parameters on Aspect Ratios Attainable in FIB Milled Features, B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F. A. Stevie, 12th Annual Workshop on Secondary Ion Mass Spectrometry, Gaithersburg, MD, April, 1999.  National.
  1. Microstructural Evaluation Of SIMS Crater Roughening, B.I. Prenitzer, L.A. Giannuzzi, B.W Kempshall, J.M. McKinley, F. A. Stevie, SIMS 12, Brussells, September, 1999, International.
  1. Damage In Silicon, C.A. Urbanik, B. I. Prenitzer, and L. A. Giannuzzi, S.R. Brown, T.L. Shofner, B. Rossie, R.B. Irwin, F. A. Stevie, Characterization Of FIB Microscopy & Microanalysis, August 1999, Portland, Poster, International.
  1. Tem FIB Lift-Out Of Mount Saint Helens Volcanic Ash, J. L. Drown-MacDonald, B. I. Prenitzer, T. L. Shofner, and L. A. Giannuzzi, Microscopy & Microanalysis, August 1999, Portland, Poster, International.
  1. In-Situ Transformation Of A Zinc Tem Lift-Out Specimen, B. I. Prenitzer, S. Collins, and L. A. Giannuzzi, Microscopy & Microanalysis, August 1999, Portland, Poster, International.
  1. L.A. Giannuzzi, B.I. Prenitzer, J. L. Drown, B.W. Kempshall, S. R. Brown, T.L. Shofner, R. B. Irwin, and F. A. Stevie, CSSP AESF, Chicago, May 1999, International.
  1. The Effect of Sputtering Rate on the Characteristics of FIB Milled Features,  B.I. Prenitzer,  C.A. Urbanik, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F. A. Stevie,  27th Annual Symposium of the Florida Chapter of the AVS and 17th Annual Meeting of the Florida Society for Microscopy, March 1999, Invited. Regional.
  1. Small Area Analysis: The Synergism of FIB/TEM Instrumentation, L.A. Giannuzzi, B.I. Prenitzer, J. L. Drown, S. R. Brown, T.L. Shofner, R. B. Irwin, and F. A. Stevie, American Vacuum Society Meeting, Baltimore, MD, November, 1998, Invited, International.
  1. The Correlation Between Ion Beam/Material Interactions and Practical FIB Specimen Preparation,  B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F. A. Stevie, AVS, October 1998.  National.
  1. The Influence of Incident Ion Range on the Efficiency of TEM and SEM Specimen Preparation of Focused Ion Beam Milling,  B.I. Prenitzer, L.A. Giannuzzi, S.R. Brown, R.B. Irwin, T.L. Shofner, F.A. Stevie, Electron Microscopy 1998, ICEM14, Symposium K, Volume III, eds., H.A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol, (1998) 711. Poster. International.
  1. Investigation of Variables Affecting Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation, B.I. Prenitzer, L. A. Giannuzzi, S. R. Brown, R. B. Irwin, T. L. Shofner, and F. A. Stevie, Microscopy and Microanalysis 1998, Atlanta, Poster. International.
  1. Advances in the FIB Lift-Out Technique for TEM Specimen Preparation: HREM Lattice Imaging, L.A. Giannuzzi, S.R. Brown, B.I. Prenitzer, J.L. Drown-MacDonald, T.L. Shofner, R.B. Irwin, and F.A. Stevie, Analysis of In-Service Failures and Advances in Microstructural Characterization, The 31st Annual Convention of the International Metallographical Society, July 1998, Ottawa, Canada. Invited. International.
  1. Material Dependence of Sputtering Behavior During Focused Ion Beam Milling: A Correlation Between Monte Carlo Based Simulation and Empirical Observation,  B.I. Prenitzer, L. A. Giannuzzi, S. R. Brown, R. B. Irwin, T. L. Shofner, and F. A. Stevie, FL AVS/FSM meeting, UCF, February, 1998, Orlando, FL,  Poster Presentation. National.
  1. The Value of Industrial/Academic Partnerships in Areas of Microelectronics and Materials Science: A Student’s Perspective,  B.I. Prenitzer, AAAS High Tech Florida Means Business, September, 1997. invited.  Regional.
  1. Focused Ion Beam Specimen Preparation of Metal Powders,  B. Prenitzer, J. Drown, L.A. Giannuzzi, R.B.Irwin, S. Brown, F. Stevie, TMS/ASM Materials Week, Sept. 1997, Indianapolis, IN. International
  1. What Causes a Rainbow,  B.I. Prenitzer, Oviedo High School,  Oviedo, FL, 1997 invited  Local.
  1. What is Energy,  B.I. Prenitzer, In house at CREOL for middle school audience,  February,1997.  Local.
  1. Volume Phase Holographic Recording in PTRG,  B.I. Prenitzer, K.C. Richardson, L.B. Glebov, J. Moharam, Fifth Annual Georgia Tech Diffractive Optics Workshop, March 1996, Atlanta, GA.  International.
  1. What Causes a Rainbow,  B.I. Prenitzer, Double R Middle School,  Geneva, FL, 1996. invited.  Local.
  1. Applications of Thermal Analysis Techniques,  B.I. Prenitzer and J.M. McKinley, Graduate Class - Chemistry of Materials, University of Central Florida, Orlando, FL 1996. invited.  Local.
  1. Crystallization Kinetics of Photo-Thermo-Refractive (PTR) Glasses,  B.I. Prenitzer, K.C. Richardson, L.B. Glebov, J. Moharam, P.J. Hood, ACS Fall Meeting of the Glass and Optical Materials Division (GOMD), New Orleans, November, 1995.  National.
Brenda Prenitzer
President and Chief Executive Officer
 
Brian Kempshall
Vice President and Chief Technical Officer
 
Jennifer McKinley
Vice President and Chief Financial Officer
 
Stephen Schwarz
Vice President and Chief Operations Officer