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The
management team of NanoSpective
has experience in both industry and academic
materials science applications. The team has experience in
multiple materials systems including semiconductors, glass and
ceramics, metals, and polymers.
 Brian Kempshall
Vice President and Chief Technical
Officer
Dr. Kempshall holds a B.S. in Mechanical
Engineering and a Ph.D. in Materials Science and Engineering
from the University of Central Florida. Dr. Kempshall has
worked at UCF’s Materials Characterization Facility as a
research assistant/associate for the past six years where he
became proficient in the use of most of the facilities
analytical equipment including Scanning Electron Microscopy (SEM),
Secondary Ion Mass Spectrometry (SIMS), Focused Ion
Beam (FIB), Transmission Electron Microscopy (TEM), and
Scanning Transmission Electron Microscopy (STEM) with X-ray
Energy Dispersive Spectroscopy (X-EDS). Additionally, Dr.
Kempshall has renowned expertise in the field of FIB TEM
specimen preparation techniques and (S)TEM analysis. Dr.
Kempshall has over 20 refereed journal articles and conference
proceedings as well as numerous platform presentations at
local, national and international conferences. He is currently
finishing a one year post-doctoral research fellowship
sponsored by Siemens-Westinghouse specializing in both the FIB
TEM specimen preparation and (S)TEM analysis of as-coated and
thermally cycled thermal barrier coatings.
Dr. Kempshall’s responsibilities include
sales operation and projections, client relations, and
assisting Dr. Prenitzer with identifying new markets. Dr.
Kempshall also provides technical direction for the company by
investigating new research opportunities and exploring new
instrument techniques. He additionally provides expertise,
training, routine service and calibration, and analysis for
the FIB and TEM instrumentation.
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