Our management team has over 200 publications in both materials science applications and theoretical studies.  Each of the team members is both nationally and internationally acclaimed has presented at conferences worldwide.

Visit the links to the left to view publications, presentations, and patents of the management team.

Refereed Journal Articles 

“Focused Ion Beam/ Lift-Out TEM Cross Sections of Block Copolymer Films Ordered on Silicon Substrates,” H. J. White, Y. Pu, M. Rafailovich, J. Sokolov, A. H. King, L. A. Giannuzzi, C. Urbanik-Shannon, B.W. Kempshall, A. Eisenberg, S. A. Schwarz, Y. M. Strzhemechny, Polymer 42 (2001) 1613-1619. 

“Ion Channeling Effects on the Focused Ion Beam Milling of Copper,” B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, Journal of Vacuum Science & Technology B 19(3) May/June (2001) 749-754.

 “A Comparative Evaluation of Focused Ion Beam CVD Processes,” B.W. Kempshall, B.I. Prenitzer, L.A. Giannuzzi, F.A. Stevie, and S.X. Da, Journal of Vacuum Science & Technology B 20(1) Jan/Feb (2002) 286-290.

 “Electron Backscattering Diffraction Investigation of Focused Ion Beam Surfaces,” T.L. Matteson, S.M. Schwarz, E.C. Houge, B.W. Kempshall, and L.A. Giannuzzi, Journal of Electronic Materials, 31(1) (2002) 33-39.

 “Microstructural Evaluation of SIMS Crater Roughening,” B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, Journal of Vacuum Science & Technology, in preparation.

 “Grain Boundary Segregation: Equilibrium and Non-Equilibrium Conditions,” B.W. Kempshall, B.I. Prenitzer, L.A. Giannuzzi, Scripta Materialia, in press. 

“Bi Segregation to <100> Cu Twist Grain Boundaries,” B.W. Kempshall and L.A. Giannuzzi, Acta Materialia, in preparation.

 “The Effect of Bi Segregation on the Ni Diffusion through <100> Cu Twist Grain Boundaries,” B.W. Kempshall and L.A. Giannuzzi, Acta Materialia, in preparation.

 “Ion Channeling Effects on the Focused Ion Beam Milling of Crystalline Materials,” B.W. Kempshall, S. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, Journal of Vacuum Science & Technology, in preparation.

Refereed Conference Proceedings

 “Focused Ion Beam Cross Sectioning of Block Copolymers Ordered on Silicon Surface,” H. White, M. H. Rafailovich, J. Sokolov, L.A. Giannuzzi, B.W. Kempshall, APS, Spring Meeting Atlanta, GA, 1999.

 “Microstructural Evaluation of SIMS Crater Roughening,” B.I. Prenitzer, L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, and F.A. Stevie, in Secondary Ion Mass Spectrometry SIMS XII, eds. A. Benninghoven, P. Bertand, H.-N. Migeon and H.W. Werner, 2000, Elsevier, Proceedings of the 12th Annual Conference on Secondary Ion Mass Spectrometry , Brussels, Belgium, 5-11 September 1999, pp. 77-80.

 “A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening,” L.A. Giannuzzi, B.W. Kempshall, B.I. Prenitzer, J.M. McKinley, F.A. Stevie, 13th Annual SIMS Workshop 2000, April 30 - May 3, 2000, Lake Tahoe, NV, pp. 19-21.

 “Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions,” B.I. Prenitzer, B.W. Kempshall, S.M. Schwarz, L.A. Giannuzzi, and F.A. Stevie, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 502-503 (2000).

 “Diffusion of Ion Implanted Elements in Silicon by TEM and SIMS,” R.R. Vanfleet, H. Francois-Saint-Cyr, F. Stevie, L. Giannuzzi, R. Irwin, B. Kempshall, T. Shofner, Microscopy & Microanalysis, 6 (Suppl 2: Proceedings), Microscopy Society of America, pp. 1082-1083 (2000).

 “Ni Diffusion in Bi Segregated [100] Cu Twist Grain Boundaries,” B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, CIMTEC 2002, in press.

 “In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials,” B.W. Kempshall and L.A. Giannuzzi, Microscopy & Microanalysis 2002, in press.

 “Automated Crystallography and Grain Mapping in the TEM,” F.B. Clayton, B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, Microscopy & Microanalysis 2002, in press.

 “FIB Damage in Silicon: Amorphization or Redeposition?,” S. Rajsiri, B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, Microscopy & Microanalysis 2002, in press.

Platform Presentations

 L.A. Giannuzzi , B.I. Prenitzer, J.L. Drown, B.W. Kempshall, S.R. Brown, T.L. Shofner, R.B. Irwin, and F.A. Stevie, CSSP AESF, Chicago, May 1999, International.

 B.I. Prenitzer , L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, F.A. Stevie, “Microstructural Evaluation Of SIMS Crater Roughening,” SIMS 12, Brussells, September, 1999, International.

 B.W. Kempshall, B.I. Prenitzer, L.A. Giannuzzi, S.X. Da and F.A. Stevie, “A Comparative Evaluation of FIB CVD Processes,” International Meeting of the American Vacuum Society, Seattle, October, 1999.

 B.I. Prenitzer , L.A. Giannuzzi, B.W. Kempshall, J.M. McKinley, F.A. Stevie, invited “Microstructural Evaluation Of SIMS Crater Roughening,” FL AVS/FSM, March, 2000, National. 

L.A. Giannuzzi, B.W. Kempshall, B.I. Prenitzer, J.M. McKinley, F.A. Stevie, “A Multidisciplinary Approach to the Understanding of Ion Induced Sputter Roughening,” 13th Annual SIMS Workshop 2000, April 30 - May 3, 2000, Lake Tahoe, NV, International.

 B.I. Prenitzer, B.W. Kempshall, S.M. Schwarz, L.A. Giannuzzi, and F.A. Stevie, “Practical Aspects Of FIB Milling: Understanding Ion Beam/Material Interactions,” invited, Microscopy & Microanalysis, Philadelphia, August, 2000, invited, International.

 B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, R.B. Irwin, F.A. Stevie, “Ion Channeling Effects on the FIB Milling of Crystalline Materials,” International Meeting of the American Vacuum Society, Boston, October, 2000. 

B.W. Kempshall, L.A. Giannuzzi, and C.H. Henegar “TEM of a SiC/Ti₃SiC₂ Joint,” American Ceramics Society 2002, St. Louis, MO, International.

 B.W. Kempshall and L.A. Giannuzzi, “In-Situ Lift-Out FIB Specimen Preparation for TEM of Magnetic Materials,” Microscopy & Microanalysis 2002.

 F.B. Clayton, B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, “Automated Crystallography and Grain Mapping in the TEM,” Microscopy & Microanalysis 2002.

 S. Rajsiri, B.W. Kempshall, S.M. Schwarz, and L.A. Giannuzzi, “FIB Damage in Silicon: Amorphization or Redeposition?,” Microscopy & Microanalysis 2002.

 B.I. Prenitzer, B.W. Kempshall, J.M. McKinley, W.H. Stinebaugh, and I. Wylie, “Characterization of Si in a W Matrix Using Diffraction Contrast in the TEM,” Microscopy & Microanalysis 2002.

Poster Presentations

 B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, “Ion Channeling Effects on the FIB Milling of Copper,” Spring Meeting of American Vacuum Society, Santa Clara, February, 2000, International.

 B.W. Kempshall, S.M. Schwarz, B.I. Prenitzer, L.A. Giannuzzi, and F.A. Stevie, “Ion Channeling Effects on the FIB Milling of Copper,” FL AVS/FSM, March, 2000, poster, National, Microscopy & Microanalysis, Philadelphia, August 2000, International.

 R.R. Vanfleet, H. Francois-Saint-Cyr, F. Stevie, L. Giannuzzi, R. Irwin, B. Kempshall, T. Shofner, “Diffusion of Ion Implanted Elements in Silicon by TEM and SIMS,” Microscopy & Microanalysis, Philadelphia, August, 2000, International.

 S.M. Schwarz, B.W. Kempshall, and L.A. Giannuzzi, “On The Validity of Volume Diffusion Data: Diffusion Induced Recrystallization in Cu-Ni Diffusion Couples,” FL AVS/FSM, March, 2001, National.